 DOCUMENT METADATASLAC Publication: SLAC-PUB-16523
SLAC Release Date: May 10, 2016
Depth Resolved Domain Mapping in Tetragonal SrTiO3 by Micro-Laue Diffraction
Merz, T.
DOI: 10.1063/1.4948351
We present depth resolved X-ray micro-Laue diffraction experiments on the low temperature domain structure of SrTiO3. At 80 K, monochromatic X-ray diffraction shows an elongated out-of-plane unit cell axis within a matrix of in-plane oriented tetragonal unit cells. Full deviatoric strain mappings from white beam diffraction show a dominance of two tetragonal domain orientations (x -and z -axis) over a large area of s... Show Full Abstract DOI: 10.1063/1.4948351
We present depth resolved X-ray micro-Laue diffraction experiments on the low temperature domain structure of SrTiO3. At 80 K, monochromatic X-ray diffraction shows an elongated out-of-plane unit cell axis within a matrix of in-plane oriented tetragonal unit cells. Full deviatoric strain mappings from white beam diffraction show a dominance of two tetragonal domain orientations (x -and z -axis) over a large area of sample surface. This information sets an upper bound on domain wall widths and offers a method for studying 3D domain structure at low temperatures. Show Partial Abstract Download File:
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