High-resolution beam position monitors (IPBPMs) have been developed in order to measure the electron beam position at the focus point of ATF2 to a few nanometers in the vertical plane. To date, the IPBPM system has operated in test mode with a highest demonstrated resolution of 8.7 nm in the ATF extraction line during 2008. After expected noise source calculations there still remains 7.9 nm of noise of unexplained origin. We summarize the experimental work on the IPBPM system since this measurement and outline the possible origins of these sources. We then present a study plan to be performed at the ATF2 facility designed to identify and to improve the resolution performance and comment on the expected ultimate resolution of this system. Show Partial Abstract