The measurement of ultra-short electron bunches on the femtosecond time scale constitutes a very challenging problem. In X-ray free-electron laser facilities such as the Linac Coherent Light Source (LCLS), generation of subten femtosecond X-ray pulses is possible, and some efforts have been put into both ultra-short electron and X-ray beam diagnostics. Here we propose a single-shot method using a transverse rf deflector (X-band) after the undulator to reconstruct both the electron bunch and X-ray temporal profiles. Simulation studies show that about 1 fs (rms) time resolution may be achievable in the LCLS and is applicable to a wide range of FEL wavelengths and pulse lengths. The jitter, resolution and other related issues will be discussed. Show Partial Abstract