There exists a need for environmental control of samples to be imaged by the Transmission X-Ray Microscope (TXM) at the SSRLs Beam Line 6-2c. In order to observe heat-driven chemical or morphological changes that normally occur in situ, microscopes require an additional component that effectively heats a given sample without heating any of the microscope elements. The confinement of the heat and other concerns about the heaters integrity limit which type of heater is appropriate for the TXM. The bulk of this research project entails researching different heating methods used previously in microscopes, but also in other industrial applications, with the goal of determining the best-fitting method, and finally in designing a preliminary sample heater. Show Partial Abstract